Computer Aided Direct Test to Ship System in Manufacturing

Generally quality control and quality assurance functions are remotely performed to ensure product conformance to the agreed specifications and standard. For this 100% testing and sampling, inspection is done in accordance with MIL-STD. This system is known to be adequate but with deficiency and creates problems due to human involvement. To overcome these problems we have developed a computer aided direct test to ship (DTTS) technique which integrates the two functions. The paper describes this new technique and reports the results obtained so far. This technique enhances the quality, reliability and yield of the device. Further, it also reduces the device manufacturing cycle time which results in lowering product cost. Although the DTTS system has been developed for IC manufacturing it would be applicable to large scale manufacturing of other products.