Design to reliability shielded vertical interconnection applied to microwave Chip Scale Packaging

This paper presents the electrical design, measurement and reliability tests of a shielded vertical interconnection dedicated to microwave solder-mount packages. Electromagnetic simulations show very good results up to 20 GHz. Test samples have been designed and manufactured. Electrical results are in accordance with the simulations with insertion loss lower than 0.1 dB up to 20 GHz for the proposed interconnection. Reliability tests of present no degradation of the after 500 thermal cycles in the [—55°C, +125°C] temperature range.