Diagnostic Tools and Techniques for GaAs Integrated Circuits (NOT PUBLISHED)

An extensive survey of diagnostic probes for the analytical characterization of GaAs Integrated Circuits (ICs) is presented. The AT&T circuits for which data are included in this study are used in a 1.7 Gbit/sec lightwave system. Some of the techniques are unique for GaAs while most can be used generically for any IC characterization or Failure Mode Analysis (FMA). This comparative study covers the principle of the method required stimulus and measured response, frequency regime of operation, types of failure modes identified, availability in the commercial market, manpower and expertise required to run it, maintenance requirements as well as capital investment and approximate value over price ratio. The results of this synopsis are used to plan FMA on field returns and reliability dropouts on the most expedient and economical basis and to increase the manufacturing yield by a feedback mechanism to design, processing, packaging and testing activities. For efficient FMA, all involved parties (design, processing, packaging, testing, lifetime evaluation and customer) are involved from the beginning (inception of customer needs), and the specific product is designed for easy "FMAability" within certain constraints.