On Guaranteed Combinational ATPG for Non-Scan and Partial Scan Sequential Circuits

A strong reason for the success of the full-scan design is that it allows the use of combinational ATPG. The state of the art in combinational ATPG gives us the capability to either find a test or prove redundancy for every fault. Such a guarantee cannot be given for non-scan or partial-scan circuits since they require the use of sequential ATPG. In this paper, we present a combinational ATPG method guaranteeing a test (or redundant status) for every fault in a sequential circuit that either is acyclic or is made that way via partial scan.