Checkpoint Faults are not Sufficient Target Faults for Test Generation

Stuck-at faults on primary inputs and fanout branches are commonly used as target faults in test generation algorithms for combinational circuits. This note shows that these faults may not constitute an adequate set of target faults. A procedure is presented for selecting a set of target faults with the property that the detection of all detectable faults from this set guarantees the detection of all detectable faults in the circuit.