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Electro-thermomigration and filament growth in P-InP with Au contacts.

01 January 1984

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Metal migration induced by electric field and temperature gradients has been studied in Zn-doped InP with Au-contacts. A new failure mode has been observed which involves a temperature induced decomposition of InP, followed by the formation of a liquid filament nucleating at the negative Au contact. The filament subsequently grows to short out the two contacts. Two forms of filaments are observed; type I is straight and narrow and contains no Au, whereas type II is broader, propagates more slowly, and contains Au. An explanation is presented to rationalize the results.