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    Interface Structures and Their Defects in CoSi sub 2 /Si: Dislocations, Disclinations and a Thin-Film Phase Transformation

Interface Structures and Their Defects in CoSi sub 2 /Si: Dislocations, Disclinations and a Thin-Film Phase Transformation

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The interface structures and interfacial defects in CoSi sub 2 /Si heteroepitaxy have been the subject of intensive study for over a decade now, but the system continues to provide us with surprises. Here we will present the results of a study of the novel CoSi sub 2 /Si(110) interface, and revisit the much-studied CoSi sub 2 /Si(111).