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Single event transient propagation through digital optocouplers

01 August 2005

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A new approach for assessing the risk of upsetting digital optocouplers due to the propagation of single event transients (SETs) is proposed. The optocoupler's input current (I-f) and propagation time (t(pHL)) are found to be the most critical parameters for this approach. A case study using the 6N140 optocoupler and SETs measured at the output of the National Semiconductor LM139 is detailed to validate the concept.