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Surface Diffusion and Islanding in Si Molecular Beam Epitaxy

05 May 1990

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The interrelation of surface diffusion and islanding has a strong influence on the growth of semiconductor heterostructures during molecular beam epitaxy (MBE), affecting properties such as optimum epitaxial temperature and critical thickness. We will review our current understanding in this area, mainly gained by ultra high vacuum scanning electron/Auger microscopy