Tutorial: Test Generation for VLSI Circuits

The objective of this book is to provide an up-to-date collection of material on VLSI testing to a practicing engineer as well as to a researcher. The book is written with both design and test engineers in mind. Chapter 1 consists of an overview of the entire field. Remaining text is divided into Chapters II through VII on fault modeling, test generation, test evaluation, testability analysis, design for testability, and automatic test equipment, respectively. The main emphasis, however, is on test generation, a topic also strongly related to fault modeling, test evaluation, and testability analysis. However, to be successful in test generation, knowledge of design for testability and the test methodology (Chapters VI and VII) is necessary.