Wavelength-dependent channel power transient response in broadband Raman-amplified transmission

The time evolution of uncontrolled amplifier gain transients due to dropped or cut dense wavelength division multiplexed channels in a broadband all-Raman amplified re-circulating loop experiment is measured for different surviving channel wavelength configurations with propagation up to 7200 km. Different time signatures develop depending on whether the surviving channels are located at the long or short wavelength end of the spectrum. Channel power tilt and gain error within a surviving channel group can vary with distance and are shown to correlate with growth of amplified spontaneous emission noise at the dropped channel wavelengths.