X-Ray and Raman Characterization of GaSb/AlSb Strained Layer Superlattices

Double-crystal rocking curves of MBE-grown samples with bilayer periods in excess of 70angstroms have been analyzed by fitting simulated rocking curves to data. Rocking curves revealed a multiplicity of superlattice peaks, and the angular position and intensity of these peaks were fit in a step model using Abeles' method. The simulations included the (100)-oriented GaSb substrate. The x-ray data in conjunction with folded acoustic mode data obtained via Raman scattering permit an evaluation of the thickness of the individual layers.