Publications

We study a number of measures that characterize the difficulty of a classification problem.

Diffusion barriers for capping porous low dielectric constant films are important for preventing metal migration into a semiconductor circuit.

Intra-class testing refers to the testing of the interaction among methods and data structures encapsulated within a single class.

Service providers must effectively manage the growing demands in mobile data traffic and optimize their capital investments. Various mechanisms exist at their disposal to: 1.

Service providers must effectively manage the growing demands in mobile data traffic and optimize their capital investments.

A technique based on a Mach-Zehnder interferometer is proposed in order to evaluate dynamical properties of optoelectronic devices.

Measuring the Utilization of a Synchronous Data Link: An Application of Busy-Period Analysis By T.

Scattering with angular limitation projection electron-beam lithography (SCALPEL) is being developed by Lucent Technologies for sub-130 nm lithography.

There is an obvious incentive for employing thermally matched materials in microelectronic structures, subjected to temperature changes.

It is obvious that matched thermal expansion (contraction) between soldered components should result in a more reliable solder joint interconnection.