In this paper, a technique based on the use of a Mach-Zehnder interferometer is proposed in order to evaluate chirp properties of optoelectronic devices.
We studied a number of measures that characterize the difficulty of a classification problem.
We study a number of measures that characterize the difficulty of a classification problem.
Diffusion barriers for capping porous low dielectric constant films are important for preventing metal migration into a semiconductor circuit.
Intra-class testing refers to the testing of the interaction among methods and data structures encapsulated within a single class.
Service providers must effectively manage the growing demands in mobile data traffic and optimize their capital investments. Various mechanisms exist at their disposal to: 1.
Service providers must effectively manage the growing demands in mobile data traffic and optimize their capital investments.
A technique based on a Mach-Zehnder interferometer is proposed in order to evaluate dynamical properties of optoelectronic devices.
Measuring the Utilization of a Synchronous Data Link: An Application of Busy-Period Analysis By T.
Scattering with angular limitation projection electron-beam lithography (SCALPEL) is being developed by Lucent Technologies for sub-130 nm lithography.
