A sub-nanosecond Time-to-Voltage Converter and Analog Memory

This thesis describes a new CMOS integrated circuit designed to measure the time interval between two digital voltage pulses. The measurement is stored as an analog voltage on a capacitor for later digitization. The targeted range of measurable times is 5-20 nanoseconds, with a resolution of 0.5 nanoseconds. 

An additional feature of the circuit is a storage depth of 8 samples, i.e. 8 consecutive time measurements may be recorded individually. Hence, the chip is a combination of a time-to-voltage converter (TVC) and an analog memory.