Estimation of Thin Oxide Reliability Using Proportional Hazards Models
01 January 1990
We present two groups of proportional hazards models to estimate dielectric reliability and time-dependent dielectric breakdown (TDDB) hazard rates.
One group of models ignores interactions between stresses (temperature T and electric field E) while the other group considers different forms of interactions. Our analysis of Hokari's TDDB data shows that the model which assumes an interaction between the covariates, 1/T and 1/E, gives the best fit of Hokari's data.