Formation and structure of new quasicrystals of Ga sub (16) Mg sub (32) Zn sub (52) and Al sub (60) Si sub (20) Cr sub (20).

We report here the formation of new quasicrystals of Ga sub (16) Mg sub (32) Zn sub (52) and Al sub (60) Si sub (20) Cr sub (20), and their structure examined with TEM and x-ray diffraction. We found that the x-ray diffraction patterns are distinctively different between these two icosahedral (i-) quasicrystals. The i-GaMgZn shows the x-ray line intensities being very similar to those of i-Mg sub 3 Zn sub 3 Al sub 2, while the i-AlSiCr to i-Al sub (74) Si sub 6 Mn sub (20).