High Speed SRAM Testing Techniques

Understanding the operation of High Speed SRAMs can significantly extend the capabilities of existing test equipment. The memory properties when properly exploited and combined with conventional Marching and Galloping Test Patterns, are shown to have a multiplier effect on the basic pattern generator speed of conventional memory test systems. GaAs SRAMs have been tested at a full 250Mhz Address Cycle Rate using an existing 50MHz DRAM test system with address multiplexing.