Improved Accuracy of Propagation Delay Measurements of Digital Logic Devices Using Automatic Test Equipment

Propagation delay inaccuracies can occur when testing digital logic devices on Automatic Test Equipment (ATE). Different measured values are obtained depending on the measurement system used. Correlation becomes a problem when attempting to compare measurements obtained from a bench test set-up and an ATE, or between two different ATEs. The difference can result in errors as large as 100%.