Improved LEED System using position sensitive detection.

An improved low energy electron diffraction (LEED) system using a two dimensional position-sensitive detector is described. The system is capable of storing LEED patterns at a resolution of 256 x 256 channels with 16 bits per channel. The electron count rate is 100 kHz maximum. A new position computer with edge gating controls and a special event counting memory interfaced to a PC is used to record the LEED intensities.