In-Stu Transmission Electron Microscopy of Surfaces and Thin Film Growth by MBE
10 March 1988
The transmission electron microscope (TEM) offers several unique features in surface science and thin film growth: strong, kinematical diffraction and imaging from monolayers and penetration to permit studies of buried interfaces. Results on in-situ studies of molecular beam epitaxy in a UHV TEM provide new insight into the transition from surface adsorbate to thin film.