Laser Programming on Gallium Arsenide HFET Digital Integrated Circuits

This work investigates the application of laser programming technology to gallium arsenide digital integrated circuits. A special GaAs IC test chip was designed to provide a vehicle to investigate some of the fundamental laser programming issues, and to explore a novel laser programmable logic array concept. The test chip has a number of different target link structures to facilitate a detailed analysis of the GaAs laser programming process. The logic array section of the test chip contains a number of programmable logic cells and I/O buffers which are attached to an interconnect grid that can be modified by the laser to generate a variety of small, high speed circuits.