Minimal length test vectors for multiple-fault detection with electron beam scanning.
20 March 1987
A methodology for circuit testing is proposed, which exploits features of electron beam scanning. Using the proposed methodology, multiple circuit faults are detected in the course of a minimal length "guided tour" of the circuit transition structure. Deriving a test vector to guide this tour through an n state subsystem with at most / inputs possible in situ at each state, corresponds to solving an open tour multigraph version of the "Chinese Postman" problem, in which out-degrees are bounded by /.