Statistical Testing

This paper is a tutorial on probabilistic and statistical techniques used in VLSI testing. Specific problems discussed include test data analysis, testability analysis, test generation, and fault coverage evaluation. Methods applied to solve these problems can be classified as statistical data analysis, probabilistic analysis, and Monte Carlo techniques. Since many of these solutions may be unconventional for practicing engineers, the paper emphasizes concepts and illustrates the advantage of such techniques in handling computationally complex problems.