Microstructure and Behavior of Laser Mixed Cr-Ni Films in Cu Alloys

Deposited thin films of Cr and Ni on Cu substrates have been melted and intermixed with a frequency doubled Q-switched Nd:YAG laser. The laser pulses melt the thin films and a shallow portion of the substrate. Resolidification interface velocities are on the order of 1-10 ms-1. Rutherford backscattering, Auger spectroscopy, and energy dispersive x-ray mapping have been used to characterize the elemental distribution. Channeling and transmission electron microscopy were used to investigate the microstructure of the surfaces produced.