New qualification approach for optoelectronic components

Optoelectronic components reliability is currently assessed through standard qualification tests. Although useful for a comparison between different products, this approach presents several drawbacks which will be discussed. A new qualification methodology is proposed to provide customers with relevant reliability data and improve the confidence level about product quality, while adapting to new market conditions and technological breakthroughs which drive the optoelectronic components. (C) 2002 Elsevier Science Ltd. All rights reserved.