On the Design of High Yield Reconfigurable PLA's

Interest is growing in Reconfigurable PLA's (RPLA's) for yield enhancement of VLSI circuits. The conventional approach used for RPLA designs is to diagnose faults first and reconfigure later. We propose a new approach in which diagnosis and reconfiguration are performed simultaneously. The new approach also takes advantage of laser programmable interconnect to simplify the test circuitry and result in a small area overhead.