On the Probability of Fault Occurrence

In this talk we introduce the probability of fault occurrence. For a modeled fault (e.g., a stuck fault) this is the probability with which the fault will occur on a chip. Of course, the occurrence of the fault is considered equivalent to the fault indication by a test capable of detecting it. We determine the probability of fault occurrence from chip test data. No attempt is made to find these probabilities provide a revised coverage requirement versus chip quality relation.