On the Relationship Between Probabilistic Testability and Fault Coverage (NOT PUBLISHED)

The lack of a direct relationship between testability analysis and fault simulation has contributed to much confusion. Although fault simulation is very expensive, its results are well understood. Testability analysis, on the other hand, is inexpensive but the results are often difficult to interpret. In this paper, we establish an integral transformation that converts probabilistic testability into fault coverage. It is further shown that this relation can easily be represented as Laplace transform.