Optical studies of thermalization mechanisms in a-Si:H.
01 January 1985
Thermalization mechanisms of photoexcited carriers in a-Si:H have been studied by monitoring the rate of spectral shift of the main luminescence band as a function of temperature. The weak temperature dependence of the shift at early times precludes any multiple trapping process based on thermal excitation to transport states, but is consistent with thermalization by direct hopping between localized states.