Performance evaluation of an X-cut Ti:LiNbO3 waveguide traveling- wave phase modulator.

We have evaluated the performance of an X-cut Ti:LiNbO3 traveling wave waveguide phase modulator at 1.523micron wavelength for modulation frequencies of 0.1 - 1 GHz. Measurements of phase shift vs. applied voltage, input polarization and modulation frequency show that the X-cut modulator is a nearly ideal device for coherent system experiments. We also describe a simple evaluation technique which can be used for rapid and accurate characterization of the dynamic performance of optical phase modulators.