Reliability of InGaAs photodiodes of SL applications.

In this paper, we describe a comprehensive reliability program which is aimed at asessing and assuring the reliability of InGaAs photodiodes. A major portion of this work has involved device operation at overstress conditions. Results to date indicate that for receiver photodiodes a design exists which is predicted to meet a 1 FIT reliability objective Tests of monitors which are of similar design, are in progress.