Reply to 'Comment on 'Characterization and Modeling of Mismatch in MOS Transistors for Precision Analog Design'

We have derived an analytical expression for the parametric yield of a DAC as a function of the matching accuracy of the unit current sources [1, eq. (35)]. Subsequently, it was pointed out in [2] that the DAC outputs are not statistically independent and hence the analytical expression is an underestimate of the true yield. This has been demonstrated by performing a Monte-Carlo simulation. The object of this reply is to modify the analytical expression given in [1] to make it agree with Monte-Carlo simulations.