Role of tip structure in scanning tunneling microscopy.
01 January 1986
A UHV scanning tunneling microscope equipped with a field ion microscope (FIM) has been built. By using the FIM image, a tungsten tip was tailored for high STM resolution in a scan of the Au(001) surface. The measured corrugation depth of the (1x5) rows was found to be a function of the size of the atomic cluster on the first plane of the tungsten tip. Two different domain structures were observed.