Study of Thermally Oxidized Yttrium Films on Silicon
01 January 1987
Electrical and structural characteristics of thin thermally oxidized yttrium layers on Si and on Si covered 40angstroms of SiO sub 2 have been investigated
We have limited content available for some countries. Find office information and country specific information through our country hub.
01 January 1987
Electrical and structural characteristics of thin thermally oxidized yttrium layers on Si and on Si covered 40angstroms of SiO sub 2 have been investigated