Testing multilane SerDes interfaces with jitter injection filters

With high speed IO interfaces approaching Terabit bandwidth, multilane SerDes (serialize/deserialize) IO architecture become promising. By puttign high speed serial data links in parallel, the IO interface bandwidth is significantly increased. The architecture, however, has imposed several challenges in producing testing. One one hand, the traditional bit error rate test can not be cost effectively deployed with massive amount of SerDes put in parallel. On the other hand, simple loopback test does not provide adequate test converage or analog performance variations. In this paper, we present a test methodology based on a passive filter technique to enhance the traditional loopback test by including jitter tests.