The structure of a-GeSe2 from x-ray scattering measurements.

Grazing incidence x-ray scattering techniques have been used to study very thin (>=250angstroms) films of amorphous GeSe2. We have found that the first sharp diffraction peak (FSDP) in these glasses arises from intrinsic features of chemically ordered tetrahedral bonding and not from a layered nature of the glass. We find no evidence of an oriented or layered structure and conclude that, if a layered structure is present, it must differ significantly from the crystalline phase.