The structure of multilayers: X-ray studies.

This paper summarizes a set of three lectures given at a NATO summer school on "Physics, Fabrication and Applications of Multilayered Structures" which was held at Ile De Bendor, France on June 22 - July 4, 1987. This is a tutorial on the different kinds of information that can be obtained using x-ray diffraction. The types of fluctuations which occur in multilayers and the prospects for more detailed characterizations using synchrotron sources are discussed. The different types of scattering geometries are compared.