Ultra-high reliability, ultra-high speed silicon integrated circuits for undersea optical communications systems.
01 January 1984
The silicon integrated circuits that will be used in the next generation of undersea cable (SL) have been designed using technology and methodology distilled and refined from that used in previous undersea system developments. This memorandum summarizes how these previous developments have influenced the design of MJIM and MCBIC circuits for SL and presents the early MJIM reliability results within the context of the data accumulated in 20 years of monitoring undersea semiconductor device reliability.