X-ray and Raman Scattering Measurements in Finite, Pseudomorphically- Strained Fibonacci Lattices.

X-ray and Raman scattering measurements have been performed on pseudomorphically strained Si-Ge sub x Si sub (1-x) Fibonacci lattices with low stage numbers. Both the x-ray and Raman measurements exhibit significant deviations from large stage behavior for Fibonacci lattices with fewer than ten stages. A kinematic expression for the diffracted x-ray intensity of a strained-layer Fibonacci lattice is derived in the limit of large stage number.