X-Ray Scattering Studies of Disordered Interfaces

There are a wide range of disordered interfaces of high scientific and technological interest. By disordered interface, we refer to such systems as an amorphous or liquid surface, an amorphous film on a crystalline film (e.g. SiO sub 2 on Si), or a liquid wetting a substrate. The combination of very bright synchrotron radiation sources and the grazing incidence x-ray scattering (GIXS) technique allow a much more thorough structural characterization of such systems than has been possible in the past. This talk will investigate the application of GIXS to the study of disordered interfaces. Our recent study of the melting of lead will be used as an example.