Application to Switching-System Development By T. T. BUTLER, T. G. HALLIN, J. J. KULZER, and K. W.
The automatic test generation system (ATG) was designed to provide fault-detection tests for single stuck-at faults in combinational and sequential circuits.
Recent advances in integrated-circuit technology offer the circuit and system designers many opportunities to explore new, lowcost, high-performance design techniques.
The use of digital simulation of logic circuits has been widely accepted in the computer and telephone industries to verify logiccircuit designs, to analyze the behavior of logic circuits in the pr
The explosive evolution of digital devices, computers, and systems since the invention of the transistor has necessitated a parallel industrywide development of tools for the design and test of log
Demand for interconnectivity from Local Area Networks (LANs) to Wide Area Networks (WANs) has been increasing rapidly.
In recent years there has been an explosive growth worldwide in cellular radio.
We study the Landau level spectrum of a two-dimensional hole gas in carbon delta-doped (100) GaAs/Al0.4Ga0.6As square quantum well (width of 15 nm) by means of microwave cyclotron resonance (CR) an
A finite transfer integral t(a) orthogonal to the conducting chains of a highly one-dimensional metal gives rise to empty and filled bands that simulate an indirect-gap semiconductor upon formation
The Landau-Khalatnikov mechanism associated with the relaxation of order parameter amplitude gives a peak in the longitudinal ultrasonic attenuation alpha near T(c), which quantitatively accounts f
