SUMMARY: An interferometric method is described for measuring the absolute value of the biconic sleeve end separation of the master sleeve used to determine the suitability of plastic product slee
We demonstrate a side-diffraction interferometric method for characterization of transmission diffraction gratings on substrates with nonflat surfaces.
Interferometry is used to study the variation of the zero dispersion wavelength (lambda0) and the group index (Ng) along the lengths of type 5D production single mode fibers.
A standing problem in low dimensional electron systems is the nature of the 5/2 fractional quantum Hall state, with its elementary excitations a focus for both elucidating the state's properties bu
The fundamental "shot-noise" limit of interferometric measurement is studied for a polarization interferometer with squeezed light entering the normally dark port.
We present interferometric operation of an electroabsorption modulator.
We present a new technique for measuring ultrashort optical pulses using spectral phase interferometry for direct electric- field reconstruction (SPIDER) which is suitable for very large bandwidth
Two interferometric techniques measuring the transmission and phase response of temporal modulators are presented.
Interferometric techniques to measure the transmission and phase response of temporal modulators are presented.
We present results of an interferometric end paint: prediction technique for use in plasma etching of various gate and localized oxidation of silicon (LOCOS) structures in advanced complementary me
