Noise reduction, which aims at estimating a clean speech from a noisy observation, has long been an active research area.
Much has occurred in the ten years since the First Edition of this book was published, to affect the field of Electromagnetic Compatibility (EMC).
The ubiquitous noise rise in Josephson parametric amplifiers was first observed over 10 years ago.
We investigate the accuracy of the femtosecond pulse-retrieval technique called phase and intensity from correlation and spectrum only (PICASO).
The reader is referred to Part I 1 for a description of the experimental apparatus and its operation.
W h e n ail RF probe is moved along a magnetically-focused electron b e a m in a drift region, t h e noise power is at first found to v a r y periodically with distance f r o m t h e electron gun.
We report an analysis of the noise statistics for an optically preamplified differential phase-shift keying (DPSK) receiver with balanced and single-port detections.
The design of electrostatic discharge (ESD) protection network in CMOS technology becomes increasingly more difficult because of shrinking device feature sizes, high operating speed, and system on
Holographic and other imaging systems utilizing coherent light introduce a speckled or noise-like pattern in the image of a diffuse object which severely degrades image quality.
The noise-testing equipment described has been specially designed to be (a) portable, (b) flexible in application, and (c) reliable.
