The memory characteristics and reliability of a SONGS nonvolatile memory device are determined, to a large extent, by the charge transport and trapping properties of its storage nitride film.
In this article statistical inference for the failure time distribution of a product from ``field return data{''}, that records the time between the product being shipped and returned for repair or
In this article we look at statistical inference for the failure time distri- bution of a product from "field return data" that records the time between the product being shipped and returned for r
This paper addresses the attachment reliability of 25 and 50 mil pitch Surface-Mount (SM) plastic leaded perimeter packages for the thermal operating conditions and design life of telecommunication
This work evaluates the reliability of a GaAs IC chip mounted on a Hybrid Integrated Circuit (HIC).
Reliability growth during development testing is achieved through an iterative process of testing to find reliability problems, incorporating design changes to correct these problems and retesting
For the first time since the advent of mobile networks, an idea furthering their pervasiveness by co-opting them into various aspects of daily life has taken hold and this idea is, henceforth, inte
This paper will review some of the open issues related to aging effects in glass fiber lightguides.
The reliability analysis of computer communication networks is generally based on Boolean algebra and probability theory.
The kinetic of dielectric charging in capacitive RF microelectromechanical systems (RF MEMS) is investigated using an original method of stress and monitoring.
