In this paper, we describe a comprehensive reliability program which is aimed at asessing and assuring the reliability of InGaAs photodiodes.
A new method has been proposed to form electrical connections vertically between two levels of metallization by using a commercial pulsed TR laser system.
The development of optical communications has generated a huge expansion of the use of optoelectronic components for transmission, mainly for transmitters, receivers and optical amplifiers.
This paper analyzes the problem of transient error recovery in fault tolerant memory systems using a scrubbing technique.
Various noise statistics on simulation have been compared with experimental data on 43 Gb/s amplitude shift keying (ASK) and differential phase shift keying (DPSK) formats for chromatic dispersion
Novel solutions are required to meet the stringent reliability and latency requirements targeted for the Ultra Reliable Low Latency Communication service class, which emerged with the introduction
This paper outlines the reliability properties of RF MEMS devices and circuits. The tools used to evaluate the reliability properties are presented.
The market of passive optical devices is evolving rapidly. New technologies are introduced that have not proven yet long-term reliability in the field.
Reliability allocation is a necessary part of development planning to achieve the product reliability requirements.
Temperature cycling tests, and statistical analysis of the results, for various high-density packages on printed-circuit boards with Sn-Cu hot-air solder levelling, electroless nickel-immersion gol
