The nickel-cadmium battery, known for its long cycle life and high energy density, is likely to remain the rechargeable battery choice for some time to come.
An experimental investigation was under taken to quantify the effect of component size, geometry and layout on fluid flow distribution in electronic circuit packs.
Molecular light scattering in the Mie and Rayleigh regime has been measured as a function of scattering angle at wavelengths between 0.6 and 2.6microns on bulk samples of ZBLAN glasses.
Due to the increased circuit current densities and temperatuers, interconnect reliability continues to be one of the major reliability concerns with the progress of device scaling.
Early electromigration failure has been recognized as a generic phenomenon in W-plug via structures.
Interchannel cross-phase-modulation-induced polarization scattering (XPMIPS) and its effect on the performance of optical polarization mode dispersion (PMD) compensation in wavelength-division-mult
A dramatic dependence on crystal stoichiometry has been observed for the donor activation of low doses of Si ions implanted into undoped semi-insulating GaAs.
Stability of sub-micron contacts under high current density has been an outstanding reliability issue in advanced Si devices.
Stability of submicron contacts under high current density has been an outstanding reliability issue in advanced Si devices.
We study the effect of dc current on microwave photoresistance in a high-mobility two-dimensional electron system.
