Displaying 31981 - 31990 of 37748

High-resolution x-ray diffraction (HRXRD) measurements of strained-layer superlattices have been carried out using a four-crystal monochromator.

High-resolution x-ray diffraction (HRXRD) measurements of strained- layer superlattices (SLS's) have been carried out using a four- crystal monochromator.

We determined by Extended X-ray Absorption Fine Structure the interface structure in hydrogenated amorphous Si-Ge and Si- SiN sub x multilayers.

A new approach to structural studies of heterostructure interfaces will be presented using the GaAs-Ge system as a model system.

This paper reports on the effect of ion implantation on the structure of highly ordered benzene-derived graphite fibers (BDGF) using high resolution transmission electron microscopy (TEM).

We have examined the unit-cell structure of the important high- temperature and high-strength polymer, poly(p-phenylene sulfide) (PPS); this has recently been in dispute, with two different models

Sm(IO sub 3)sub 3 . H sub 2 O is polar and isomorphous with Nd(IO sub 3)sub 3 . H sub 2 O and is of potential interest for its nonlinear optic properties.

The structure of the Au segregated Ni(110)-0.8% Au surface has been studied by scanning tunneling microscopy.

The previously proposed island-dimer model of the Si(111)-7x7 surface [E. G. McRae, Surf. Sci.

We determined by Extended X-ray Absorption Fine Structure (EXAFS) that the interfaces in hydrogenated amorphous Si-Ge superlattices are atomically abrupt and the interface atoms are bound on averag

Explore more

Video

AI-enhance wireless reliability: joint source and channel coding for robust 6G air interface

Podcast

A 2025 recap of "a bit of tech"