High-resolution x-ray diffraction (HRXRD) measurements of strained-layer superlattices have been carried out using a four-crystal monochromator.
High-resolution x-ray diffraction (HRXRD) measurements of strained- layer superlattices (SLS's) have been carried out using a four- crystal monochromator.
We determined by Extended X-ray Absorption Fine Structure the interface structure in hydrogenated amorphous Si-Ge and Si- SiN sub x multilayers.
A new approach to structural studies of heterostructure interfaces will be presented using the GaAs-Ge system as a model system.
This paper reports on the effect of ion implantation on the structure of highly ordered benzene-derived graphite fibers (BDGF) using high resolution transmission electron microscopy (TEM).
We have examined the unit-cell structure of the important high- temperature and high-strength polymer, poly(p-phenylene sulfide) (PPS); this has recently been in dispute, with two different models
Sm(IO sub 3)sub 3 . H sub 2 O is polar and isomorphous with Nd(IO sub 3)sub 3 . H sub 2 O and is of potential interest for its nonlinear optic properties.
The structure of the Au segregated Ni(110)-0.8% Au surface has been studied by scanning tunneling microscopy.
The previously proposed island-dimer model of the Si(111)-7x7 surface [E. G. McRae, Surf. Sci.
We determined by Extended X-ray Absorption Fine Structure (EXAFS) that the interfaces in hydrogenated amorphous Si-Ge superlattices are atomically abrupt and the interface atoms are bound on averag
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