Publications

This tutorial chapter discusses the techniques of spectrum processing and data manipulation required to obtain quantitative microanalytical data from transmission electron energy loss spectra.

The solutions to many real-world problems require reasoning under uncertainty (also known as inexact, approximate, or evidential reasoning).

We measure the impact forces and deflections resulting from drop tests of a mass with a flat impact surface onto flat pads of various elastomeric materials, and show that the forces can be predicte

The optimal compositions of many commercial glasses (such as window glass) are close to the ternary 74SiO(2)-16Na(2)O-10CaO.

Recent reports have demonstrated the possibility of probing acceptor concentrations in bulk semi-insulating GaAs by electronic Raman scattering using 1.06microns radiation.[1] The inefficiency of

Secondary Ion Mass Spectrometry (SIMS) has been used to identify and quantify contaminants in TaSi sub 2 thin films.

We review the use of transmission electron microscopy (TEM) to provide a quantitative measurement of both vacancy and interstitial clusters in ion implanted silicon.

To monitor plasma charging damage, it is common to use extremely large antenna ratio (AR) testers to improve sensitivity.

We have observed quantization of the diagonal resistance, R-xx, at the edges of several quantum Hall states.

Quantization of the Hall effect and concomitantly vanishing magnetoresistance are observed in a GaAs-(AlGa)As superlattice structure whose electronic spectrum exhibits dispersion in all three spati