Thsi paper investigates the fabrication of titanium silicided shallow n sup + p and p sup + n junctions.
A high resolution transmission electron microscopy (TEM) technique of imaging Si(111) planes at Si/SiO sub 2 interface and an accurate measurement of the state in silicon sigma sub si just below t
Optical performance monitoring using data stream autocorrelation is analyzed in simulations and experiments for impairments of interest in practical optical networks.
Silicon carbide (SiC) epitaxial channel MOSFETs have been fabricated on 6H SIC substrates with NS epitaxial source and drain electrodes.
We demonstrate an efficient solution to characterize multi-core and few mode optical amplifiers by using a swept wavelength interferometer in a reflection mode.
Swept-wavelength interferometry can rapidly characterize the amplitude and phase transfer matrices of multi-mode fibers and components.
We present single-scan measurements of the transfer matrix of space-division multiplexed systems including the mode-multiplexers and fibers.
Mixed rare earth oxides of the form La sub 2-x-y RE sub x M sub y CuO sub 4, where RE is a light rare earth and M is an alkaline earth, crystallize in the T*-structure which is intermediate between
We study the temporal fluctuations of a fixed wireless link in an urban environment by characterizing the Ricean K-factor as a function of the positioning of the customer premises antenna.
We present experimental investigations of the dynamical properties of semiconductor optical amplifiers and their impacts in the all-optical signal processing using semiconductor optical properties.
